| Publication Type |
Journal Article |
| School or College |
College of Science |
| Department |
Physics |
| Creator |
Williams, Clayton C. |
| Other Author |
Abraham, David W.; Wickramasinghe, H. K. |
| Title |
Noise reduction technique for scanning tunneling microscopy |
| Date |
1988 |
| Description |
Noise stemming from mechanical vibration, electronic noise, or low frequency (l / f power spectrum) inherent in the tunneling process, often limits the resolution, speed, or range of application of scanning tunneling microscopy (STM). We demonstrate a technique for minimizing the effect of these noise sources on the STM image. |
| Type |
Text |
| Publisher |
American Institute of Physics (AIP) |
| Journal Title |
Applied Physics Letters |
| Volume |
53 |
| Issue |
16 |
| First Page |
1503 |
| Last Page |
1505 |
| DOI |
10.1063/1.99940 |
| citatation_issn |
36951 |
| Subject |
Noise reduction; Dithering; Graphite |
| Subject LCSH |
Electronic noise; Scanning tunneling microscopy |
| Language |
eng |
| Bibliographic Citation |
Abraham, D. W., Williams, C. C., & Wickramasinghe, H. K. (1988). Noise reduction technique for scanning tunneling microscopy. Applied Physics Letters, 53(16), Oct., 1503-5. |
| Rights Management |
(c)American Institute of Physics. The following article appeared in Abraham, D. W., Williams, C. C., & Wickramasinghe, H. K., Applied Physics Letters, 53(16), 1988 and may be found at http://dx.doi.org/10.1063/1.99940 |
| Format Medium |
application/pdf |
| Format Extent |
663,750 bytes |
| Identifier |
ir-main,8584 |
| ARK |
ark:/87278/s6rv167z |
| Setname |
ir_uspace |
| ID |
706007 |
| Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6rv167z |
