Publication Type |
Journal Article |
School or College |
College of Engineering |
Department |
Materials Science & Engineering |
Creator |
Liu, Feng |
Other Author |
Jaloviar, S. G.; Lin, Jia-Ling; Zielasek, V.; McCaugham, L.; Lagally, M. G. |
Title |
Step-induced optical anisotropy of vicinal Si(001) |
Date |
1999-01 |
Description |
It is demonstrated, using reflectance difference spectroscopy, scanning tunneling microscopy, and low-energy electron diffraction, combined with deliberate straining of the surface, that the presence of atomic steps dramatically changes the optical anisotropy of the Si(001) surface. The step-induced reflectance difference signal originates predominately from rebonded steps and is comparable in magnitude to that of the terrace signal. |
Type |
Text |
Publisher |
American Physical Society |
Journal Title |
Physical Review Letters |
Volume |
82 |
Issue |
4 |
First Page |
791 |
Last Page |
794 |
DOI |
10.1103/PhysRevLett.82.791 |
citatation_issn |
0031-9007 |
Subject |
Step-induced; Optical anisotropy; Vicinal Si(001); Electron diffraction; Atomic steps |
Subject LCSH |
Anisotropy; Reflectance spectroscopy; Scanning tunneling microscopy; Strain theory (Chemistry) |
Language |
eng |
Bibliographic Citation |
Jaloviar, S. G., Lin, J.-L., Liu, F., Zielasek, V., McCaugham, L., & Lagally, M. G. (1999). Step-induced optical anisotropy of vicinal Si(001). Physical Review Letters, 82(4), 791-4. |
Rights Management |
(c) American Physical Society http://dx.doi.org/10.1103/PhysRevLett.82.791 |
Format Medium |
application/pdf |
Format Extent |
211,622 bytes |
Identifier |
ir-main,12202 |
ARK |
ark:/87278/s6gx4vwp |
Setname |
ir_uspace |
ID |
704751 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6gx4vwp |