Characterization of interfacial water at hydrophilic and hydrophobic surfaces by in situ FTIR/internal reflection spectroscopy

In-situ FTIR/internal reflection spectroscopy (FTIR/IRS) has been used to spectroscopically characterize interfacial water near hydrophilic (silicon single crystal) and hydrophobic (polymer-coated germanium single crystal) surfaces. Interfacial water was examined spectroscopically over certain distances from the surface by appropriate design of the geometry and optics of the internal reflection system. The in-situ FTIR/IRS spectra were characterized by consideration of the OH stretching region (3000-3800 cm"1) associated with the vibrational spectra of the interfacial water. Preliminary spectral results indicate the prevalence of an ice-like structure at the hydrophilic silicon surface, whereas at the hydrophobic surface the ice like structure is not so prevalent and there appears to be a significant decrease in hydrogen bonding.