MEMS testing: transition from millions to billions to trillions

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Publication Type pre-print
School or College College of Engineering
Department Mechanical Engineering
Creator Roundy, Shadrach J.
Other Author Bryzek, Janusz
Title MEMS testing: transition from millions to billions to trillions
Date 2012-01-01
Description Sensors, specifically MEMSbased, have created multiple market tornados over the past 40 years. Most recently there has been a market explosion driven by the widespread adoption of MEMS sensing devices in mobile consumer applications. In the past 5 years the worldwide market has grown from roughly 10 million to 3 billion sensors in mobile devices, representing a growth rate of over 200%/ year. The total market is expected to grow to at least 16 billion sensors in the next 5 years, and a trillion sensors in 10 years.
Type Text
Publisher Chip Scale Review Magazine
First Page 1
Last Page 3
Language eng
Bibliographic Citation Bryzek, J., & Roundy, S. J. (2012). MEMS testing: transition from millions to billions to trillions. Chip Scale Review, 1-3
Rights Management (c) Chip Scale Review Magazine
Format Medium application/pdf
Format Extent 497,307 bytes
Identifier uspace,18278
ARK ark:/87278/s6bg36v8
Setname ir_uspace
Date Created 2013-05-28
Date Modified 2013-05-29
ID 708823
Reference URL https://collections.lib.utah.edu/ark:/87278/s6bg36v8
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