Pulsed laser deposition and characterization of Zn1-xMnxO films

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Publication Type Journal Article
School or College College of Engineering
Department Materials Science & Engineering
Creator Tiwari, Ashutosh
Other Author Jin, C.; Kvit, A.; Kumar, D.; Muth, J.; Narayan, J.
Title Pulsed laser deposition and characterization of Zn1-xMnxO films
Date 2002
Description Here we present our results of structural, optical, and magnetic measurements of Zn1-xMnxO thin films. These films were grown epitaxially on (0001) sapphire substrates by using pulsed laser deposition technique. The maximum Mn content (x=0.36) is found to be much higher than allowed by thermal equlibrium limit (x~0.13) due to the non-equilibrium nature of the pulsed laser deposition. All the films investigated here were found to be single phase with <0001> orientation epitaxial relationship. A linear increase in the c-axis lattice constant was observed with increase in Mn concentration. Optical transmittance measurements showed an increase in the insulating band-gap (Eg) with increase in Mn concentration. DC magnetization measurements showed that there is no long range ferromagnetic ordering down to 10 K.
Type Text
Publisher Materials Research Society
Volume 692
First Page 637
Last Page 642
Subject LCSH Epitaxy; Metal oxide semiconductors; Zinc oxide; Thin films; Epitaxy; Semiconductor doping
Language eng
Bibliographic Citation Jin, C., Tiwari, A., Kvit, A., Kumar, D., Muth, J., & Narayan, J. (2002). Pulsed laser deposition and characterization of Zn1-xMnxO films. MRS Proceedings, 692, H11.5, 637-42.
Rights Management © Materials Research Society http://www.mrs.org/
Format Medium application/pdf
Format Extent 1,989,314 bytes
Identifier ir-main,12088
ARK ark:/87278/s67d3cqx
Setname ir_uspace
Date Created 2012-06-13
Date Modified 2021-05-06
ID 706693
Reference URL https://collections.lib.utah.edu/ark:/87278/s67d3cqx
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