Atomic ordering of GaInP studied by Kelvin probe force microscopy

Update item information
Publication Type Journal Article
School or College College of Engineering
Department Electrical & Computer Engineering; Materials Science & Engineering
Creator Stringfellow, Gerald B.; Williams, Clayton C.
Other Author Leng, Y.; Su, L.C.
Title Atomic ordering of GaInP studied by Kelvin probe force microscopy
Date 1995
Description The atomic ordering of GaInP has been established and studied by a variety of methods, including transmission electron microscopy, cathodoluminescence, and photoluminescence. In this work, a Kelvin probe force microscope _x0002_KPFM_x0003_ has been employed to image several GaInP samples previously characterized by these established techniques. The results of our study clearly show that the KPFM is capable of distinguishing between ordered and disordered regions in GaInP, and that the KPFM contrast strongly depends on the amplitude of the applied ac bias voltage of the KPFM. The measurements indicate that ordering in GaInP modifies the density and/or lifetime of the surface states.
Type Text
Publisher American Institute of Physics (AIP)
Volume 66
Issue 10
Subject Cathodoluminescence; Photoluminescence; Surface morphology
Subject LCSH Surface active agents; Order-disorder in alloys
Language eng
Bibliographic Citation Leng, Y., Williams, C.C., Su, L.C., & Stringfellow, G.B. (1995). "Atomic ordering of GaInP studied by Kelvin probe force microscopy." Applied Physics Letters, 66(10), 1264.
Rights Management (c)American Institute of Physics. The following article appeared in (Leng, Y., Williams, C.C., Su, L.C., & Stringfellow, G.B., Applied Physics Letters. 66(10), 1995
Format Medium application/pdf
Format Extent 197,042 bytes
Identifier ir-main,1924
ARK ark:/87278/s6th957r
Setname ir_uspace
Date Created 2012-06-13
Date Modified 2021-05-06
ID 706437
Reference URL https://collections.lib.utah.edu/ark:/87278/s6th957r
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