Low-power STDR CMOS sensor for locating faults in aging aircraft wiring

Update Item Information
Publication Type Journal Article
School or College College of Engineering
Department Electrical & Computer Engineering
Creator Harrison, Reid R.
Other Author Sharma, Chirag R.; Furse, Cynthia
Title Low-power STDR CMOS sensor for locating faults in aging aircraft wiring
Date 2007-01
Description A CMOS sensor used to locate intermittent faults on live aircraft wires is presented. A novel architecture was developed to implement the Sequence Time Domain Reflectometry method on a 0.5- m integrated circuit. The sensor locates short or open circuits on active wires with an accuracy of +/-1 ft when running at a clock speed of 100 MHz. A novel algorithm is proposed that utilizes the shape of the correlation peak to account for sub-bit delay, thus increasing the accuracy of fault location. The power consumed by the microchip is 39.9 mW.
Type Text
Publisher Institute of Electrical and Electronics Engineers (IEEE)
Journal Title IEEE Sensors Journal
Volume 7
Issue 1
First Page 43
Last Page 50
DOI 10.1109/JSEN.2006.886866
citatation_issn 1530-437X
Subject CMOS sensor; Pseudo-random noise; Reflectometry Methods; Spread spectrum; Wire fault location; Time Domain Vernier (TDV) method
Subject LCSH Integrated circuits; Metal oxide semiconductors; Airplanes -- Electric wiring -- Testing; Electric fault location -- Data processing
Language eng
Bibliographic Citation Sharma, C. R., Furse, C., & Harrison, R. R. (2007). Low-power STDR CMOS sensor for locating faults in aging aircraft wiring. IEEE Sensors Journal, 7(1), 43-50.
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Format Medium application/pdf
Format Extent 841,734 bytes
Identifier ir-main,13945
ARK ark:/87278/s6pg296q
Setname ir_uspace
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Reference URL https://collections.lib.utah.edu/ark:/87278/s6pg296q
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