Electrical detection of spin coherence in silicon

Update Item Information
Publication Type Journal Article
School or College College of Science
Department Physics
Creator Boehme, Christoph
Other Author Lips, Klaus
Title Electrical detection of spin coherence in silicon
Date 2003-12
Description Experimental evidence is presented showing that photocurrents in silicon can be used as highly sensitive readout probes for coherent spin states of localized electrons, the prime candidates for quantum bits in various semiconductor based quantum computer concepts. Conduction electrons are subjected to fast Rabi oscillation induced by means of pulsed electron spin resonance. The collective spin motion of the charge carrier ensemble is reflected by a spin-dependent recombination rate and therefore by the sample conductivity. Because of inhomogeneities, the Rabi oscillation dephases rapidly. However, a microwave induced rephasing is possible causing an echo effect whose intensity contains information about the charge carrier spin state and the coherence decay.
Type Text
Publisher American Physical Society
Journal Title Physical Review Letters
Volume 91
Issue 24
DOI 10.1103/PhysRevLett.91.246603
citatation_issn 0031-9007
Subject Spin coherence; Electronic transitions; Rabi oscillation
Subject LCSH Ion recombination; Semiconductors -- Recombination; Silicon -- Electric properties; Quantum computers
Language eng
Bibliographic Citation Boehme, C., & Lips, K. (2003). Electrical detection of spin coherence in silicon. Physical Review Letters, 91(24), 246603.
Rights Management (c) American Physical Society http://dx.doi.org/10.1103/PhysRevLett.91.246603
Format Medium application/pdf
Format Extent 104,297 bytes
Identifier ir-main,11985
ARK ark:/87278/s6sf3dgh
Setname ir_uspace
ID 704359
Reference URL https://collections.lib.utah.edu/ark:/87278/s6sf3dgh
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