Publication Type |
Journal Article |
School or College |
College of Science |
Department |
Physics |
Creator |
Williams, Clayton C. |
Other Author |
Abraham, David W.; Wickramasinghe, H. K. |
Title |
Measurement of in-plane magnetization by force microscopy |
Date |
1988 |
Description |
We present data which show that the magnetic force microscope is capable of detecting the component of the magnetic field parallel to the surface of a sample under study. Images of bits in a Co-alloy thin-film disk and of laser-written bits in a TbFe film were taken with a magnetized tip tilted at 45° with respect to the surface normal. In both cases the asymmetric part of the image of a domain is interpreted in terms of gradients in the in-plane component of the magnetic field. The bits written in the Co-alloy disk were decorated with small magnetized particles, allowing identification of the domain boundaries and the asymmetric component of the force microscope image due to in-plane magnetization. |
Type |
Text |
Publisher |
American Institute of Physics (AIP) |
Journal Title |
Applied Physics Letters |
Volume |
53 |
Issue |
15 |
First Page |
1446 |
Last Page |
1448 |
DOI |
10.1063/1.99964 |
citatation_issn |
36951 |
Subject |
Co-alloy disc; Magnetization |
Subject LCSH |
Magnetic force microscopy; Magnetism; Thin films |
Language |
eng |
Bibliographic Citation |
Abraham, D. W., Williams, C. C., & Wickramasinghe, H. K. (1998). Measurement of in-plane magnetization by force microscopy. Applied Physics Letters, 53(15), Oct., 1446-8. |
Rights Management |
(c)American Institute of Physics. The following article appeared in Abraham, D. W., Williams, C. C., & Wickramasinghe, H. K., Applied Physics Letters, 53(15), 1988, and may be found at http://dx.doi.org/10.1063/1.99964 |
Format Medium |
application/pdf |
Format Extent |
536,980 bytes |
Identifier |
ir-main,8585 |
ARK |
ark:/87278/s6cc1jb6 |
Setname |
ir_uspace |
ID |
707221 |
Reference URL |
https://collections.lib.utah.edu/ark:/87278/s6cc1jb6 |